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| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VistaScope |
| Price Range | USD 420,000 – 700,000 |
| Instrument Type | Material Science AFM |
| Position Detection Noise | ≤ 50 pm RMS |
| Sample Dimensions | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| XY Stage Travel Range | 6 mm × 6 mm |
| Brand | SWIFT |
|---|---|
| Origin | United Kingdom |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SWIFT In Situ Tensile Stage |
| Instrument Classification | In Situ Mechanical Testing Stage |
| Application Field | Materials Science |
| Maximum Load Capacity | 10 kN |
| Temperature Range | 0–1200 °C |
| Tensile Load Capacity | 10 kN |
| Stroke | 26 mm |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | 8500 |
| Price Range | USD 135,000 – 205,000 (FOB) |
| Electron Gun Type | Cold Field-Emission (CFE) |
| Secondary Electron Imaging Resolution | 10 nm @ 1 kV |
| Magnification Range | 250× – 800,000× |
| Accelerating Voltage | 0.5 – 2.0 kV |
| Brand | SHNTI |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Category | Imported |
| Model | SN-LDE |
| Pricing | Upon Request |
| Frame Dimensions | 5×5 mm, 7.5×7.5 mm, or 10×10 mm |
| Window Aperture | 1.0×1.0 mm to 5.0×5.0 mm (square) |
| Si₃N₄ Membrane Thickness | 50–200 nm (custom 30–500 nm, MOQ 100 pcs) |
| Frame Thickness | 200 µm, 381 µm, or 525 µm |
| Surface Roughness | <1 nm RMS |
| Max Operating Temperature | 1000 °C |
| Vacuum Rating | ≥1 atm differential pressure (dependent on membrane thickness & aperture size) |
| Chemical Stability | Inert, compatible with plasma, glow discharge, and mild chemical cleaning (no ultrasonication) |
| Origin | USA |
|---|---|
| Supplier Type | Authorized Distributor |
| Import Status | Imported |
| Available Volumes | 50 mL, 100 mL, 200 mL, 500 mL (aqueous or organic dispersion) |
| Pricing | Upon Request |
| Brand | Molecular Vista |
|---|---|
| Origin | USA |
| Model | Vista-SNOM |
| Positioning Detection Noise | ≤ 50 pm RMS |
| Sample Size | Ø ≤ 25 mm, Thickness ≤ 10 mm |
| Sample Stage Travel Range | 6 mm × 6 mm |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | Ntegra Spectra |
| Pricing | Available Upon Request |
| Origin | Czech Republic |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | LiteScope |
| Price Range | USD 65,000–130,000 |
| Instrument Type | Atomic Force Microscope |
| Positional Detection Noise | AFM-in-SEM Integration |
| Sample Dimensions | In-situ AFM-compatible |
| Stage Travel Range | 100 × 100 × 100 µm |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Prime |
| Price Range | USD 135,000 – 205,000 |
| Instrument Type | Atomic Force Microscope (AFM)-Based Scanning Microwave Impedance Microscope |
| Positional Detection Noise | 0.01 nm |
| Scan Area | 20 µm × 20 µm (model-dependent) |
| Stage Travel Range | 100 µm × 100 µm × 10 µm |
| Origin | Imported |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Model | NTegra Platform Series (Prima, Aura, Therma, Maximus, Solaris, Vita, Tomo, Spectra) |
| Pricing | Available Upon Request |
| Brand | Norcada |
|---|---|
| Origin | Canada |
| Model | NHB-SNL |
| Price Range | USD $45,000–$95,000 |
| Application Domain | Energy Storage & Battery Research |
| Instrument Type | In Situ Heating & Electrical Biasing Holder |
| Maximum Pressure | 100 Pa (compatible with TEM/SEM vacuum environments) |
| Current Measurement Range | pA to nA (configurable controller-dependent) |
| Temperature Range | Up to 1100 °C (in situ heating) |
| Voltage Range | Up to 40 V DC |
| Fluid Compatibility | Sealed MEMS cell design enables stable liquid/gas phase operation under high vacuum (≤10⁻⁵ mbar) |
| Brand | SHNTI (Shanghai NTI Instruments) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Product Origin | Imported |
| Model | TEM-SN |
| Accelerating Voltage Compatibility | Up to 300 kV (compatible with standard TEMs operating at 70–300 kV) |
| Magnification Range | Optimized for high-resolution imaging ≥100× |
| Frame Dimensions | 3 mm × 3 mm |
| Window Aperture | 0.5 mm or 1.0 mm (square) |
| Si₃N₄ Membrane Thickness | 50 nm or 100 nm (customizable from 30–200 nm, MOQ 100 pcs) |
| Frame Thickness | 200 µm or 381 µm |
| Surface Roughness | 0.6–2 nm RMS |
| Thermal Stability | Stable up to 1000 °C in inert/vacuum environments |
| Chemical Resistance | Inert to most acids, bases, and organic solvents (except hot phosphoric acid and strong alkalis) |
| Hydrophobicity | Native hydrophobic surface |
| Cleaning Method | Compatible with O₂ plasma, Ar/O₂ glow discharge, and chemical etching (e.g., Piranha: H₂SO₄:H₂O₂ = 1:1 |
| RCA1 | H₂O:HCl:H₂O₂ = 5:3:3) |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Genesis Apollo X/XL |
| Price Range | USD 68,000 – 136,000 (based on FOB USD conversion) |
| Electron Source Compatibility | Tungsten Filament SEMs |
| Brand | NT-MDT |
|---|---|
| Origin | Russia |
| Model | Solver Next |
| Instrument Type | Atomic Force Microscope |
| Z-direction Position Detection Noise | 0.02 nm (low-current mode) |
| Maximum Sample Dimensions | Ø ≤ 20 mm, Height ≤ 10 mm |
| XY Sample Stage Travel Range | 5 mm × 5 mm |
| Scan Range (Closed-loop) | 100 µm × 100 µm × 10 µm |
| Z-noise (RMS, 10–1000 Hz) | ≤ 0.04 nm (closed-loop), 0.02 nm (low-current mode) |
| XY Nonlinearity | ≤ 0.1% (closed-loop) |
| Video Microscope Resolution | 2 µm |
| Temperature Control Range | Room Temperature to 150 °C |
| Origin | USA |
|---|---|
| Manufacturer Type | Distributor |
| Origin Category | Imported |
| Model | VertiSense |
| Price Range | USD 14,000 – 72,000 (based on AFM integration configuration) |
| Instrument Type | Atomic Force Microscope (AFM)-Compatible Thermal Scanning Probe Module |
| Temperature Resolution | ≤ 10 mK (dependent on host AFM electronics and thermal calibration) |
| Spatial Thermal Resolution | ≤ 20 nm (tip-limited, under optimal vacuum/low-noise conditions) |
| Maximum Tip Operating Temperature | 700 °C |
| Sample Stage Compatibility | Fully compatible with standard commercial AFM sample stages (e.g., Bruker Dimension, Keysight 5500, Park Systems XE-series, Nanosurf Flex-Axiom) |
| Brand | NanoMagnetics |
|---|---|
| Origin | United Kingdom |
| Model | ezAFM |
| Instrument Type | Material-Grade AFM |
| Position Detection Noise | 75 fm/√Hz |
| Maximum Sample Dimensions | 10 × 10 × 5 mm |
| XY Stage Travel Range | 38 × 38 mm |
| Scan Areas | 120 × 120 × 40 µm (Z resolution: 0.2 nm) or 40 × 40 × 4 µm (Z resolution: 0.02 nm) |
| Lateral Resolution | 16 nm (large scan) / 5 nm (high-res scan) |
| Optical View System | Full HD CCD, 2 µm resolution, 390 × 230 µm FOV, 2516 × 1960 pixels, 30 fps |
| Controller | 24-bit ADC/DAC, FPGA/DSP-based digital feedback |
| Standard Imaging Modes | Contact, Tapping, Phase, LFM, MFM |
| Extended Modes (ezAFM+) | EFM, KPFM, C-AFM, SSRM, PRFM, FMM, nanomechanical mapping, liquid-phase, vacuum-compatible configurations |
| Brand | Park SYSTEMS |
|---|---|
| Origin | Fujian, China |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Domestic (China) |
| Model | NX10 High-Precision Atomic Force Microscope (SHNTI) |
| Price Range | USD 95,000 – 218,000 |
| Instrument Type | Atomic Force Microscope (AFM) |
| Application Class | Materials Science AFM |
| Brand | NT-MDT |
|---|---|
| Origin | Imported |
| Manufacturer Type | Authorized Distributor |
| Model | Solver P47-Pro |
| Pricing | Available Upon Request |
| Measurement Modes | STM, AFM (Contact/Tapping/Non-contact), LFM, Phase Imaging, Force Modulation, Force Spectroscopy, Adhesion Mapping, MFM, EFM, Kelvin Probe, SSRM, Nanoindentation, Voltage/Force Nanolithography |
| Scanning Configurations | Sample Scanning, Tip Scanning, Dual-Scan Option |
| Max Sample Size (Sample Scan) | Ø40 mm × 10 mm |
| XY Sample Positioning Range | 5 × 5 µm |
| Positioning Accuracy | ±5 µm |
| Environmental Operation | Ambient Air, Controlled Atmosphere, Liquid Cell Compatible |
| Temperature Control | Room Temperature to 130 °C |
| Optical System | Custom-Configurable |
| SPM Techniques Supported | >40 Quantitative Modes |
| Brand | Nanosensors (distributed by SHNTI) |
|---|---|
| Origin | Switzerland |
| Probe Type | Tapping Mode AFM Cantilevers |
| Substrate Material | Boron-Doped Silicon (5×10²⁰/cm³) |
| Substrate Dimensions | 1.6 mm × 3.6 mm × 0.4 mm |
| Reflective Coating | Au (3× reflectivity vs. uncoated) |
| Tip Radius | ≤10 nm (SEM-verified, S-series option available) |
| Tip Height | 10–15 µm |
| Cantilevers per Chip | 2 rectangular beams |
| Aspect Ratio | 3:1 |
| Half-Angle | ≤22° |
| Conductive Coating Options | TiN, W₂C, Pt, Au |
| Compatibility | Universal SPM platforms (Bruker, Keysight, Park Systems, NT-MDT, etc.) |
| Brand | SHNTI |
|---|---|
| Origin | Netherlands |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | Phenom G2 |
| Price Range | USD 70,000–140,000 |
| Instrument Type | Benchtop SEM |
| Electron Source | Lanthanum Hexaboride (LaB₆) |
| Secondary Electron Image Resolution | ≤5.0 nm at 10 kV |
| Magnification Range | 10×–130,000× |
| Accelerating Voltage | 5–15 kV (adjustable in 1 kV steps) |
| Backscattered Electron Image Resolution | ≤7.0 nm at 10 kV |
| Maximum Sample Dimensions | 100 mm diameter × 50 mm height |
| Expandable Chamber Interface Ports | 1 (for optional EDS or cathodoluminescence modules) |
| Stage Type | Motorized XY-stage with tilt (±90°), rotation (360°), and Z-height adjustment |
| Brand | Appo |
|---|---|
| Origin | United Kingdom |
| Model | SWIFT |
| Max Load Capacity | 10 kN |
| Temperature Range | –120 °C to +1000 °C |
| Stroke Range | 16–26 mm |
| Compatibility | SEM, TEM, Optical Microscope, Confocal Microscope, EBSD, Raman, XRD, AFM, Metallographic Microscope |
| Control Interface | Windows 10–compatible PC-based controller with drag-and-drop test sequencing software |
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