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| Brand | Olympus |
|---|---|
| Origin | Japan |
| Model | LEXT OLS4100 |
| Type | Laser Scanning Confocal Microscope |
| Optical Resolution (XY) | 0.12 µm |
| Axial Resolution (Z) | 10 nm |
| Laser Wavelength | 405 nm |
| Detection System | Dual-Confocal Optical Architecture |
| Measurement Modes | 7 |
| Imaging Modes | Confocal, DIC-Laser (Laser Differential Interference Contrast), Multi-Layer Surface Analysis |
| Vibration Isolation | Integrated Composite Damping Mechanism (Spiral Spring + Damping Rubber) |
| Compliance | Designed for ISO/IEC 17025-aligned metrology workflows, supports GLP/GMP documentation traceability |
| Brand | Olympus |
|---|---|
| Origin | Japan |
| Model | LEXT OLS4500 |
| Type | Hybrid Optical/Laser/Probe Microscope |
| Measurement Range | Millimeter to Nanometer Scale |
| Max Magnification | Up to 1,000,000× |
| Objective Lenses | Four Motorized Objectives (Low-to-Ultra-High Magnification) |
| SPM Integration | Integrated Lens-Type SPM Head on Motorized Nosepiece |
| SPM Modes | Contact, Dynamic, Phase, Current, Surface Potential, Magnetic Force (Optional) |
| Alignment | Coaxial and Confocal Objective–Cantilever Configuration |
| Automation | Guided Workflow for Rapid 3D Topography Acquisition and Analysis |
| Compliance | Designed for ISO/IEC 17025-aligned metrology workflows, supports GLP/GMP documentation traceability |
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