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| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | LEED 800 |
| Pricing | Upon Request |
| Brand | Angstrom |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ELS5000 |
| Pricing | Upon Request |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | LUMO |
| Pricing | Upon Request |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-90 |
| Operating Frequency | 90 MHz |
| Sample Type | Solid & Liquid (Broadband) |
| Magnet Type | AlNiCo Permanent Magnet |
| Resolution | < 0.5 Hz (at 90 MHz, 1H, in DMSO-d6) |
| Sensitivity | < 0.001 mmol/L (for 1H, typical small-molecule sample) |
| Cryogen-Free Operation | Yes (No Liquid Helium or Liquid Nitrogen Required) |
| Compliance | ASTM E2831-18 (Standard Guide for NMR Spectroscopy Data Reporting), ISO/IEC 17025:2017 (for lab accreditation readiness), GLP/GMP-compatible data audit trail via software |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-60, EFT-90 |
| Operating Frequency | 60 MHz / 90 MHz |
| Sample Type | Liquid |
| Measurement Principle | Pulsed Fourier Transform NMR |
| Magnet Type | AlNiCo Permanent Magnet |
| ¹H Resolution | < 0.5 Hz |
| Sensitivity | < 0.001 mmol/L (for ¹H, standard sample) |
| Supported Nuclei | ¹H, ¹³C, ¹⁹F, ³¹P, ²³Na, ⁵⁹Co, ²⁹Si, and other quadrupolar/low-γ nuclei |
| Software Platform | EFT-NMR Console v4.x |
| Compliance | ASTM E2857, ISO/IEC 17025 (method validation support), GLP-ready audit trail logging |
| Brand | Anasazi |
|---|---|
| Origin | USA |
| Model | EFT-60 |
| Operating Frequency | 60 MHz |
| Magnet Type | AlNiCo Permanent Magnet |
| Sample Form | Solid and Liquid (with appropriate probes) |
| Resolution (1H) | < 0.5 Hz |
| Sensitivity (1H) | < 0.001 mmol/L |
| Nuclei Supported | ¹H, ¹³C, ¹⁹F, ³¹P, ²³Na, ⁵⁹Co, ²⁹Si |
| Cryogen-Free Operation | Yes |
| Compliance | ASTM E2874, ISO/IEC 17025 (when operated under GLP conditions), FDA 21 CFR Part 11 (software-enabled audit trail) |
| Brand | AML |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | SEMETROL HERA-DLTS |
| Price Range | USD 120,000 – 280,000 |
| Instrument Class | Semiconductor Defect Characterization System |
| Brand | Angstrom (USA) |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RVL2000 |
| Pricing | Upon Request |
| Brand | PHI |
|---|---|
| Origin | Japan |
| Model | Genesis 500 |
| Type | Fully Automated Scanning Focused XPS System |
| Sample Stage | Motorized 3-Position Carousel (80 mm × 80 mm trays) |
| Microprobe Spot Size | ≤ 5 µm |
| Depth Profiling | Integrated High-Performance Ar⁺ Ion Gun + Dual-Beam Charge Neutralization |
| Optional Techniques | UPS, LEIPS, REELS, AES, HAXPES, GCIB Sputtering |
| Software Platform | PHI SmartSoft Suite with GLP/GMP-Compliant Audit Trail & 21 CFR Part 11 Support |
| Compliance | ASTM E1521, ISO 18118, ISO 21365, USP <1057>, IEC 62304 |
| Brand | PHI |
|---|---|
| Origin | Japan |
| Model | oTOF 3 |
| Instrument Type | Time-of-Flight (TOF) |
| Primary Beam Energy | 30 kV |
| Mass Range | 15,000 u |
| Mass Resolution | 13,500 |
| Configuration | Parallel Imaging MS/MS |
| Charge Neutralization | Dual-beam (low-energy electrons + low-energy inert gas ions), self-regulating, position-resolved |
| Optional Features | Dual-cluster ion source, sub-500 nm HR2 chemical imaging, DE-free acquisition mode, high beam current HR2 imaging, large angular acceptance & depth of field |
| Brand | JEOL |
|---|---|
| Origin | Japan |
| Model | JNM-ECZL400R |
| NMR Frequency | 400 MHz (¹H) |
| Magnet Type | Superconducting, Cryogen-Free Option Available |
| Field Homogeneity | < 0.1 Hz/30 min (shimmed) |
| Temperature Control Range | –140 °C to +140 °C |
| Sample Format | Solid, Semi-Solid, Gel, Liquid, and Heterogeneous Samples |
| Probe Compatibility | Broadband Solid-State MAS Probes (e.g., 2.5–4 mm rotors), Static & Variable-Temperature Configurations |
| Optional FFC Module | SPINMASTER FFC2000 (0.01–42 MHz field-cycling range) |
| Optional SMARTracer Module | 0.1–10 MHz |
| Optional 3 T Permanent Magnet Add-on | Extends ¹H Larmor frequency to ~130 MHz |
| Sample Tube Standard | 4 mm or 3.2 mm ZrO₂ MAS rotors (solid) |
| Brand | PHI |
|---|---|
| Origin | Japan |
| Model | PHI 700 |
| Type | Scanning Auger Electron Spectrometer |
| Detection Principle | Auger Electron Spectroscopy (AES) |
| Spatial Resolution | <10 nm (beam diameter) |
| Energy Resolution | ≤0.3% at E₀ = 1 keV |
| Ion Sputtering Energy Range | 0.1–5 keV |
| Maximum Magnification | >500,000× |
| Depth Profiling Capability | Sub-nanometer to several micrometers |
| Sample Stage | High-precision motorized XYZ + tilt/rotation |
| Vacuum System | Ultra-high vacuum (UHV), base pressure ≤2×10⁻¹⁰ Torr |
| Brand | Edinburgh Instruments |
|---|---|
| Origin | United Kingdom |
| Model | FLS1000 |
| Spectral Range | 185 nm – 5500 nm |
| Lifetime Range | 10 ps – 10 s |
| Sensitivity (RMS) | >35,000:1 |
| Monochromator Focal Length | 325 mm |
| Grating Configuration | Interchangeable triple-grating turret (single- or dual-monochromator options) |
| Software | FluOracle® v4.x (supports ASTM E275, ISO 11698, USP <1031>, GLP-compliant audit trail & 21 CFR Part 11 optional modules) |
| Brand | Makeway |
|---|---|
| Origin | Shanghai, China |
| Model | MKW-5250 |
| Energy Resolution | 40 meV |
| X-ray Source | Al Kα (1486.6 eV) |
| Spatial Resolution | ≤ 5 µm (focused monochromated beam) |
| Analysis Area | Up to 300 µm × 300 µm |
| Detection Sensitivity | 11,800 kcps (for C 1s at pass energy 20 eV) |
| Sample Stage | Motorized XYZ + tilt/rotation |
| Compatible Techniques | XPS, UPS, LEIPS, REELS, AES, HAXPES (with optional Cr/Mg anode), GCIB depth profiling, angle-resolved XPS (AR-XPS) |
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