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| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 1000 |
| Voltage Range | ±12 V (expandable to ±10 kV) |
| Frequency Range | 0.01 Hz – 1 kHz |
| Fatigue Test Frequency | up to 50 kHz |
| Minimum Pulse Width | 20 µs |
| Output Impedance | 50 Ω |
| Max Capacitive Load | 100 nF |
| Output Current | ±50 mA |
| Current Amplification Range | 1 nA – 1 A |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 2000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | 0.001 Hz – 5 kHz |
| Minimum Pulse Width | 2 µs |
| Minimum Rise Time | 1 µs |
| Current Measurement Range | 1 pA – 1 A |
| Maximum Load Capacitance | 1 µF |
| Peak Output Current | ±1 A |
| Module Options | FE (Ferroelectric), MR (Magnetoresistive), RX (Relaxation Current), DR (Dielectric Retention) |
| Channel Capacity | 256-channel automated testing |
| Brand | aixACCT Systems GmbH |
|---|---|
| Model | ESPY31 |
| Origin | Germany |
| Core Principle | Direct quasi-static force–charge transduction under controlled mechanical loading |
| Measurement Standards | Traceable to PTB (Physikalisch-Technische Bundesanstalt) calibration protocols |
| Key Specifications | d₃₁/d₃₂ range: 0.05–2000 pC/N |
| Force resolution | 0.1 mN (static/dynamic) |
| Current resolution | 100 fA |
| Charge accuracy | sub-pC |
| Repeatability (PVDF) | < 0.03 pC/N (1σ) |
| Reproducibility (PVDF) | < 0.1 pC/N |
| Frequency range | 0.1–500 Hz |
| Static preload | 0.1–5 N |
| Dynamic load | 0–1000 mN |
| Sample dimensions | 4.5 mm × 2 mm, thickness 10 µm–1 mm |
| Environmental operation | −20 °C to +80 °C, 10–85 % RH |
| Compliance | ASTM D790, ISO 6722, IEC 62047-23, USP <1051>, GLP-compliant data audit trail |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | up to 1 MHz (High-Speed FE Module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Maximum Fatigue Frequency | 16 MHz |
| Current Amplification Range | 1 pA to 1 A |
| Max Load Capacitance | 1 nF |
| Peak Output Current | ±1 A |
| Software Platform | aixPlorer v5.x (Windows 7/10 compatible) |
| Compliance | ASTM D991, IEC 62047-18, ISO/IEC 17025-ready architecture |
| Modularity | FE, MR, RX, DR modules |
| Brand | aixACCT |
|---|---|
| Origin | Germany |
| Model | TF Analyzer 3000E |
| Voltage Range | ±25 V (extendable to ±10 kV) |
| Hysteresis Frequency | up to 1 MHz (high-speed FE module) |
| Minimum Pulse Width | 50 ns |
| Minimum Rise Time | 10 ns |
| Fatigue Test Frequency | up to 16 MHz |
| Current Measurement Range | 1 pA – 1 A |
| Maximum Load Capacitance | 1 nF |
| Output Current Peak | ±1 A |
| Software Platform | aixPlorer v7.x (Windows 7-based) |
| Compliance | GLP/GMP-ready architecture, ASTM E2941-22 compatible, supports 21 CFR Part 11 audit trails (with optional software license) |
| Brand | WEP |
|---|---|
| Origin | Germany |
| Model | CVP21 |
| Measurement Principle | Electrochemical Capacitance–Voltage (ECV) Profiling |
| Carrier Concentration Range | 1×10¹¹ to 1×10²¹ cm⁻³ |
| Depth Resolution | Down to ≤1 nm |
| Compatible Substrates | Conductive & insulating |
| Wafer Size Support | 4×2 mm² to 200 mm (8″) |
| Material Compatibility | Si, Ge, SiC, GaAs, InP, GaN, AlGaN, InGaN, AlInN, ZnO, CdTe, HgCdTe, and multicomponent III–V/II–VI compounds |
| Automation Level | Fully automated with real-time corrosion monitoring, dry-in/dry-out handling, and camera-assisted process control |
| Brand | Toho |
|---|---|
| Origin | Japan |
| Model | ECVpro+ |
| Measurement Principle | Electrochemical C–V Profiling |
| Carrier Concentration Range | 1×10¹¹ to 1×10²¹ cm⁻³ |
| Depth Resolution | Down to ≤1 nm |
| Sample Compatibility | Si, Ge, SiC, GaAs, InP, GaN, AlGaN, InGaN, AlInN, ZnO, CdTe, HgCdTe, and multicomponent III–V/II–VI semiconductors |
| Automation Level | Fully Automated (Dry-In/Dry-Out, Auto-Load/Unload/Reload) |
| System Architecture | Modular, Cleanroom-Compatible, Optically & Electrically Isolated Subsystems |
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