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| Brand | Hprobe |
|---|---|
| Origin | France |
| Model | IBEX-300 |
| Wafer Compatibility | 100–300 mm |
| Magnetic Field Orientation | Full 3D vector control (in-plane & out-of-plane) |
| Field Scan Speed | Sub-second field reorientation |
| Integrated Calibration | On-board Hall sensors with traceable calibration |
| Software Suite | MRAM characterization, sensor parameter extraction, and automated test sequencing |
| Probe Interface | Compatible with standard RF/microwave and DC probe cards |
| Compliance | Designed for ISO/IEC 17025-aligned lab environments and GLP-compliant magnetic device qualification |
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