Empowering Scientific Discovery

Shanghai Microwell Semiconductor Technology Co., Ltd.

Categories
  • All
  • Favorite
  • Popular
  • Most rated
Added to wishlistRemoved from wishlist 0
Add to compare
BrandHprobe
OriginFrance
ModelIBEX-300
Wafer Compatibility100–300 mm
Magnetic Field OrientationFull 3D vector control (in-plane & out-of-plane)
Field Scan SpeedSub-second field reorientation
Integrated CalibrationOn-board Hall sensors with traceable calibration
Software SuiteMRAM characterization, sensor parameter extraction, and automated test sequencing
Probe InterfaceCompatible with standard RF/microwave and DC probe cards
ComplianceDesigned for ISO/IEC 17025-aligned lab environments and GLP-compliant magnetic device qualification
Show next
InstrumentHive
Logo
Compare items
  • Total (0)
Compare
0