Chemical Analysis Instruments
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| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max RAPID |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-Standing |
| X-ray Source Options | 3 kW Sealed-Tube or 18 kW Rotating-Anode Anode |
| Detector | Large-Area Cylindrical 2D Imaging Plate (IP), 466 mm × 256 mm |
| Angular Range | –60° to +144° 2θ |
| Beam Conditioning | Incident-Beam Monochromator |
| Collimators | 800, 300, 100, 50, 30 µm (optional 10 µm) |
| Compliance | Designed for ISO/IEC 17025-compliant laboratories |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | D/max-2600/PC |
| X-ray Generator Power | 9 kW |
| Goniometer Type | Vertical or Horizontal Wide-Angle |
| Minimum Step Angle | 0.0001° |
| Variable Aperture Slit | Programmed |
| Optical Configurations | Focusing and Parallel Beam (Switchable) |
| Monochromator | High-Efficiency Graphite |
| Detector | D/teX-Ultra (Energy Resolution <20%) |
| Automation | Fully Automated Alignment & Calibration |
| Software Suite | Comprehensive XRD Analysis Package |
| Sample Types | Powder, Bulk, Thin Film, Micro-region, Trace |
| Environmental Capabilities | In-situ HT/VT/LT, Humidity, Electrochemical, Magnetic Field |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | GOX Series |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 40 W |
| Elemental Range | S (Sulfur) |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Power Supply | 220 V AC, 2 A |
| Sample Preparation | None required |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Configuration | Benchtop |
| Analytical Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Power Requirement | 220 V AC, 2 A |
| Cooling | Air-cooled (no water or cryogenic cooling required) |
| Gas Requirement | None (helium-free operation) |
| Sample Preparation | None (direct solid/liquid analysis) |
| Primary Application | Total sulfur analysis in petroleum fuels |
| Optical System | Patented fixed-channel monochromator optimized for S Kα detection |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Micro-Z Cl |
| Instrument Type | Benchtop |
| Excitation Mode | Single-Wavelength |
| Analyte | Total Chlorine |
| X-ray Tube Power | 80 W |
| Detection Limit | 0.11 ppm |
| Quantification Range | 0–5 wt% |
| Analysis Time | 300 s |
| Vacuum Requirement | Yes (gas-free operation) |
| Compliance | SH/T 0977, ASTM D7536 |
| Operating Environment | 10–40 °C, <80% RH |
| Dimensions (W×D×H) | 45 × 41 × 43 cm |
| Weight | 40 kg |
| Power Supply | AC 200–240 V |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Mini-Z |
| Detection Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Sample Throughput | 6-position automated sample changer |
| Power Requirement | 220 V AC, 2 A |
| Dimensions | 640 × 580 × 580 mm (W × D × H) |
| Weight | 65 kg |
| Detection Limit for S | 0.3 ppm |
| Precision (S at 10 ppm in gasoline) | σ = 0.17 ppm |
| S Quantification Range | 1 ppm – 4 wt% |
| Compliant Standards | ASTM D2622, ISO 20884, JIS K2541-7 |
| Cooling | Air-cooled (no water or gas required) |
| Operation Interface | Touchscreen control panel |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Mini-Z |
| Type | Wavelength Dispersive XRF (WDXRF) |
| Configuration | Benchtop |
| Compliance | ASTM D2622, ISO 20884, JIS K 2541-7 |
| Detection Limit (S) | 0.3 ppm |
| Repeatability (S at 10 ppm) | σ = 0.17 ppm |
| S Quantification Range | 1 ppm – 4 wt% |
| Sample Capacity | 6-position automated changer |
| Power Requirement | 220 V AC, 2 A |
| Cooling | Air-cooled (no water required) |
| Dimensions | 640 × 580 × 580 mm (W × D × H) |
| Weight | 65 kg |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex / Ultima IV / SmartLab |
| Configuration | Benchtop & Floor-Standing |
| Application Type | General-Purpose |
| Elemental Analysis Range | Not applicable (XRD is phase-structural, not elemental) |
| Detection Principle | Bragg diffraction of monochromatic Cu Kα X-rays (λ = 1.5418 Å) |
| Angular Range | 2θ = −5° to 160° (SmartLab), −2° to 140° (Ultima IV), 5° to 80° (MiniFlex) |
| Minimum Step Size | 0.0001° (SmartLab), 0.001° (Ultima IV), 0.01° (MiniFlex) |
| Detector Options | D/teX Ultra (energy-resolving, <20% FWHM at Mn Kα), PILATUS 100K/R (2D photon-counting), scintillation counter |
| Optical Systems | CBO Cross-Beam Optics (patented), fixed or variable divergence/slits, monochromator (graphite or multilayer), in-plane arm, SAXS/Ultra-SAXS module, thin-film optics, micro-diffraction optics |
| Compliance | IEC 61000-6-3, IEC 61000-6-4, JIS Z 3103, FDA 21 CFR Part 1020.40, ISO 17025 (when operated under accredited lab conditions) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex 600 |
| Instrument Type | Benchtop Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| Power Output | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | ~80 kg |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Compatible with D/teX Ultra2 high-speed 1D array detector |
| Optional Accessories | Monochromator (Kβ suppression), Rotating Sample Stage, Air/Moisture-Sensitive Sample Stage, 6-Position Auto-Sampler |
| Software Suite | PDXL (Qualitative & Quantitative Analysis), ICDD PDF-4+ Database Integration, Dust Quantification Module (for occupational hygiene applications), Multi-Scan Acquisition, Rietveld Refinement (optional module) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Miniflex 600 |
| X-ray Tube Power | 600 W |
| Dimensions (W×H×D) | 560 × 700 × 395 mm |
| Weight | 80 kg |
| Goniometer Accuracy | ±0.01° 2θ |
| Safety | Interlocked X-ray shutter with automatic beam cutoff during sample loading |
| Detector | Standard scintillation counter |
| Sample Stage | Manual stage standard |
| Software Suite | PDXL (with ICDD PDF-4+ database), Qualitative & Quantitative Analysis modules, Multi-scan acquisition, Dust-specific quantification (e.g., respirable crystalline silica per ISO 16258-1, NIOSH 7500) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Benchtop X-ray Powder Diffractometer |
| Model | MiniFlex Series (e.g., MiniFlex 600 or MiniFlex 700) |
| Geometry | Bragg–Brentano θ–θ |
| X-ray Source | Cu Kα (40 kV / 15 mA sealed-tube), optional Co or Mo anodes |
| Detector | High-resolution silicon strip detector (D/teX Ultra or CBO detector) |
| Angular Range | 5°–85° 2θ (standard), extendable to 120° 2θ |
| Step Size | 0.01°–0.1° 2θ |
| Scan Speed | Up to 30°/min 2θ |
| Sample Stage | Manual or motorized θ–θ goniometer with sample spinner |
| Dimensions | 560 W × 460 D × 700 H mm |
| Weight | ~70 kg |
| Compliance | CE, UL/CSA, RoHS |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MiniFlex600 |
| Instrument Type | Powder X-ray Diffractometer |
| Power Rating | 0.0001 kW |
| Dimensions | 560 W × 460 D × 700 H mm |
| Detector Type | Advanced Semiconductor Detector |
| Software Suite | PDXL (Phase Identification, Quantitative Analysis, Rietveld Refinement, Crystal Structure Visualization) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | MSF-3M / PSF-3M |
| Configuration | Benchtop & Portable Versions |
| X-ray Source | Cr-target tube, 30 kV / 10 mA (300 W max) |
| 2θ Angular Range | 140°–170° (standard), 120°–150° (austenite measurement accessory) |
| Operating System | Windows XP |
| Compliance | IEC 61000-6-3, IEC 61000-6-4, JIS Z 3060, ASTM E915-22, ISO 21943:2020 |
| Safety | Interlocked beam shutter, emergency stop, real-time radiation monitoring, sample chamber door interlock |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Nano3DX & 3D CT |
| Configuration | Benchtop and Floor-Standing Options |
| Application Scope | Universal Materials Characterization |
| Elemental Analysis Capability | Not Applicable (Non-destructive Imaging, Not Spectrometric) |
| Spatial Resolution | Sub-micron (Nano3DX), Micron-scale (3D CT) |
| Field of View | Adjustable from ~100 µm to >50 mm |
| Contrast Sensitivity | Optimized for Density Variations in Low-Z and Medium-Z Materials |
| Repeatability | Engineered for high scan-to-scan reproducibility under controlled environmental conditions |
| Compliance | Designed to support GLP/GMP-aligned workflows |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | NANOPIX |
| Instrument Type | Integrated SAXS/WAXS Scattering System |
| Measurement Range (q) | 0.02 – 5.0 nm⁻¹ (corresponding to real-space d-spacing: 0.16 – 288 nm) |
| Beam Size | Ø70 µm |
| Sample Requirement | ≥ few mg (solid), ≥ few µL (liquid) |
| Data Acquisition Time | As low as <60 s per frame (depending on flux, sample scattering power, and detector integration time) |
| X-ray Source | MM007HF microfocus rotating anode or FR-X sealed-tube source |
| Beam Conditioning | Selectable pinhole collimation (1-, 2-, or 3-pinhole configurations) |
| Sample Stages | GI-SAXS/WAXS stage, cryo/variable-temperature stage (−150 °C to +400 °C), vacuum-compatible stage, tensile stage, multi-axis goniometer |
| Detector | HyPix-3000 or HyPix-6000 hybrid pixel array detector (2D) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Configuration | Benchtop |
| Analytical Principle | Wavelength Dispersive X-Ray Fluorescence (WDXRF) |
| Elemental Range | F (Z=9) to U (Z=92) |
| Light Element Performance | Optimized for F, Na, Mg, Al, Si quantification |
| Detector Type | Scintillation + Flow Proportional Counters (no liquid nitrogen or water cooling required) |
| Diffracting Crystals | Triple-crystal auto-exchanger (PET, LiF, TAP) |
| Sample Handling | Single-position stage or 12-position rotating autosampler |
| Software Suite | Qualitative & quantitative analysis with Fundamental Parameters (FP) algorithm |
| Compliance | Designed for ISO 8258, ASTM E1361, and IEC 62321-5 workflows |
| Regulatory Support | Audit-trail enabled data management compliant with GLP/GMP documentation requirements |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RIGAKU NEX CG |
| Price Range | USD 42,000 – 70,000 (FOB) |
| Form Factor | Benchtop (not handheld — corrected per technical specification) |
| Elemental Range | Na (11) to U (92) |
| Quantification Range | 0.1 ppm to 100 wt% |
| Energy Resolution | ≤140 eV at Mn Kα |
| Repeatability | ≤0.1% RSD for major elements under controlled conditions |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX CG II |
| Element Range | Na (11) to U (92) |
| Detection Limits (typical for petroleum) | Si 1.1 ppm, P 0.8 ppm, S 0.5 ppm, Cl 0.4 ppm, Mn 0.9 ppm, Fe 0.7 ppm, Pb 0.7 ppm |
| Concentration Range | 0.11 ppm – 10% |
| Energy Resolution | <140 eV (Mn Kα) |
| Repeatability | 0.05% RSD |
| Detector | Silicon Drift Detector (SDD) with Peltier cooling |
| Excitation Source | Pd anode X-ray tube, max 50 kV / 50 W |
| Polarization Optics | 5-position polarized secondary target assembly |
| Geometry | Cartesian 3D configuration (X-ray tube → polarizer → sample → detector) |
| Sample Volume | 5 mL |
| Autosampler | 15-position carousel |
| Calibration Method | Compton scattering C/H ratio correction |
| Data Output | USB 2.0 and Ethernet (RJ-45), CSV/PDF export |
| Dimensions | 463 × 492 × 382 mm (W×D×H) |
| Power | AC 200–240 V, 50/60 Hz, 1.6 A |
| Operating Environment | 18–28 °C, RH <75% non-condensing, vibration-free, non-corrosive atmosphere |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | NEX DE |
| Detection Range | Na to U |
| Sample Volume | 5 mL |
| Analysis Time | 30–900 s (standard: 300 s) |
| Compliance | ASTM D4294, ASTM D8252, ASTM D6481, GB/T 17040 |
| Excitation Filtration | Multi-layer composite filters |
| Operating Temperature | 10–35 °C |
| Relative Humidity | <80% RH (non-condensing) |
| Data Output | USB + Ethernet |
| Software | QuantEZ |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | NEX QC+ |
| Application Form Factor | Benchtop (Not Handheld) |
| Elemental Range | Na (11) to U (92) |
| Quantitative Range | 0.1 ppm to 100 wt% |
| Energy Resolution | ≤140 eV at Mn Kα |
| Short-Term Repeatability | ≤0.1% RSD (for major elements, 100 s counting) |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | Primus |
| Pricing | Upon Request |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | PSPC-MSF3M |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Detection Principle | X-ray Diffraction (XRD) with Position-Sensitive Detector (PSD) |
| Measurement Method | Sin²ψ technique (dual ψ₀ and ψ tilt modes) |
| Sample Compatibility | Metallic alloys, welds, castings, plastic-molded parts with crystalline fillers, heat-treated components |
| Non-destructive | Yes |
| Safety Compliance | IEC 61010-1, JIS Z 4950, Class I X-ray Equipment |
| Regulatory Conformance | Meets requirements for ISO 21943:2020 (Residual Stress Measurement by XRD), ASTM E915-22 (Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement) |
| Brand | Rigaku |
|---|---|
| Origin | USA |
| Model | RCH-IV |
| Temperature Range | Ambient to 250 °C |
| Shrinkage Measurement Range | −5% to +40% |
| Shrinkage Force Range | 0–25 N |
| Test Positions | 3 (Shrinkage ×2, Force ×1) |
| Compliance | GB/T 9101–2002, GB/T 9102–2003, GB/T 19390–2003, ASTM D4974 |
| Power Supply | 220 V / 50 Hz |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 14 |
| Element Range | Be (4) to U (92) |
| Simultaneous Channels | Up to 40 |
| Detection Limit | 0.0001% |
| Analytical Range | 0.0001% – 100% |
| Footprint | 1 m² |
| Light Element Capability | Be, B, C, N, O, F |
| Vacuum Control | APC (Automatic Pressure Control) |
| Sample Changer Options | ASC8 (standard), ASC20/50/100 (optional) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix 15 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Analytical Element Range | Be (4) to U (92) |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Detector Configuration | Simultaneous Multi-channel (Standard 30 channels, upgradable to 40) |
| Optional Features | XRD Channel, Curved Crystal Optics, Automatic Pressure Control (APC), Background Measurement (BG), Compton Scattering Ratio Calibration, Unattended Operation with 48-position ASC |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Simultix15 |
| Instrument Type | Simultaneous Multi-Channel WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Range | Beryllium (Be, Z=4) to Uranium (U, Z=92) |
| Simultaneous Channels | Up to 40 elements |
| Detector System | High-speed pulse-height-analyzed proportional counters with background subtraction circuitry |
| Vacuum System | Dual-stage vacuum pump with auto-stabilized vacuum control |
| Software | Multi-tasking, multi-window FP (Fundamental Parameters) quantification software with Chinese GUI (localized for operator interface only) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Configuration | Benchtop or Floor-Standing |
| Instrument Type | General-Purpose XRD System |
| X-ray Source Options | 3 kW or 9 kW Sealed-Tube or Rotating-Anode Generator |
| Anode Materials | Cu, Cr, Fe, Co, Ni, Mo, Ag, Au (user-selectable) |
| Goniometer Radius | 300 mm |
| Optical Flexibility | Interchangeable Fixed/Variable Incidence Optics without Realignment |
| Modular Attachment Support | Compatible with HT Furnace, Humidity Chamber, Stress Stage, Texture Stage, and In Situ Reaction Cells |
| Compliance | Designed to meet ISO 17025 laboratory requirements |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab |
| X-ray Source | 3 kW or 9 kW sealed-tube generator |
| Anode Materials | Cu, Cr, Fe, Co, Ni, Mo, Ag, Au (selectable) |
| Goniometer Radius | 300 mm |
| Detector | HyPix-3000 2D pixel array detector |
| Optics | CBO-Auto (automated beam optics switching) and CBO-μ (high-resolution micro-beam optics) |
| Primary Source | PhotonMax high-brilliance X-ray tube |
| Software | SmartLab Studio II (with in-situ analysis modules) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Model | SmartLab SE |
| X-ray Generator Power | 3 kW |
| Goniometer Radius Options | 185 mm (standard), 285 mm (optional), 280 mm (TTR configuration) |
| Optical Configurations | Automated切换 between Bragg-Brentano (focused beam) and parallel-beam geometries |
| Detector | Rigaku HyPix-400 or equivalent high-speed 2D photon-counting detector |
| Safety Enclosure | Interlocked, fail-safe shutter-equipped X-ray housing |
| Goniometer Orientation | Horizontal |