Chemical Analysis Instruments
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Showing 7411–7440 of 10690 results
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW |
| Goniometer Type | Horizontal |
| Goniometer Radius | 300 mm |
| Programmable Variable Slit | Yes |
| Minimum Step Size | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented by Rigaku) |
| Detectors | D/teX Ultra250 (0D/1D mode), HyPix-400 Semiconductor Array Detector (0D/1D/2D mode) |
| Software | SmartLab Studio II |
| Sample Viewing | Integrated Video Observation System |
| Compliance | Designed for ASTM E975, ISO 17892-12, and JIS Z 8821 applications |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW (standard), optional 9 kW rotating anode |
| Goniometer | Horizontal, high-precision dual-optical-encoder with direct-on-axis positioning |
| Minimum Step Angle | 0.0001° (0.1 arcsec) |
| Optical System | CBO Cross-Beam Optics (focusing & high-intensity parallel-beam with mirror) |
| Detector Options | D/teX-Ultra (energy resolution <20%), PILATUS 100K/R (2D pixel array, direct-beam capable) |
| Software | SmartLab Guidance (intelligent workflow-driven analysis) |
| Optional Modules | SAXS/Ultra-SAXS, Thin-Film (out-of-plane & in-plane), Micro-area (CBO-F), Ka₁ monochromator |
| Compliance | Designed for ISO 17025-compliant labs |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartLab Series |
| Instrument Type | Powder X-ray Diffractometer |
| Configuration | Floor-standing |
| X-ray Generator Power | 3 kW standard, optional 9 kW rotating anode |
| Goniometer Minimum Step | 0.0001° (1/10,000°) |
| Angular Accuracy | Dual optical encoder, direct-on-axis positioning |
| Optical System | CBO Cross-Beam Optics (patented) |
| Detector Options | D/teX-Ultra high-speed energy-discriminating detector (energy resolution <20%), PILATUS 100K/R 2D pixel array detector |
| Software | SmartLab Guidance (patented intelligent measurement & analysis platform) |
| Optional Modules | SAXS/Ultra-SAXS, thin-film analysis (including In-Plane geometry), micro-area mapping (CBO-F optics), monochromated Kα₁ beam optics |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | SmartSite RS |
| Weight | 3 kg |
| Dimensions (Test Head) | 114 mm (W) × 248 mm (D) × 111 mm (H) |
| Detector Type | Dual semiconductor-based 2D area detectors |
| X-ray Source | Microfocus sealed-tube anode (Cr, Fe, Co, Cu selectable) |
| ψ-angle range | −60° to +60° |
| 2θ-angle range | 70° to 160° (adjustable per material and reflection) |
| Safety | Integrated laser alignment, 3-axis accelerometer for tilt monitoring, optional lead-lined shielding enclosure for lab use |
| Control Interface | Android-based touchscreen tablet with LAN/Wi-Fi connectivity |
| Compliance | IEC 61000-6-3, IEC 61000-6-4, JIS Z 4901:2020 (X-ray equipment safety), ISO 21940-11 (residual stress measurement — XRD method) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini 200 |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Oxygen (O, Z=8) to Uranium (U, Z=92) |
| Instrument Class | Scanning-type WDXRF |
| Compliance | CE certified |
| Cooling | Air-cooled tube |
| Gas Consumption | Low-flow P-10 gas (Ar/CH₄) |
| Sample Handling | 12-position automatic sampler |
| Operating Environment | Vacuum or He-purged |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 200 W |
| Elemental Range | O (8) to U (92) |
| Cooling | Air-cooled (no liquid nitrogen or external water cooling required) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 Cl |
| X-ray Tube | Pd anode, 50 kV / 4 mA, 200 W |
| Detection Limits | Cl: 0.1 ppm, S: 0.1 ppm, Si: 0.5 ppm, Pb: 0.2 ppm |
| Analytical Standards | ASTM D7536 (Cl), SH/T 0842 (S), SH/T 0977 (Cl), SH/T 0993 (Si), ASTM D5059 (Pb) |
| Sample Types | Liquid hydrocarbons (gasoline, diesel, naphtha, jet fuel, crude oil, residuum), aqueous matrices (including wastewater), solid catalysts, polypropylene |
| Optical System | Multi-crystal automatic switching spectrometer |
| Automation | Integrated 12-position autosampler |
| Software | Full-featured Windows-based platform with qualitative/quantitative analysis, standardless semi-quantitative mode, spectral calibration, thin-film correction, and reference database matching |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 S |
| Instrument Type | Benchtop WDXRF Spectrometer |
| Excitation | Monochromatic Pd-target X-ray Tube (50 kV, 4 mA, 200 W) |
| Analyte Elements | Total S (ASTM D7039), Total Cl (ASTM D5059), Total Si (SH/T 0993), Total Pb (ASTM D5059) |
| Detection Limits | S: 0.1 ppm, Cl: 0.1 ppm, Si: 0.5 ppm, Pb: 0.2 ppm |
| Quantification Range | 0–99.99 wt% |
| Detector Linear Range | kcps |
| Beryllium Window Thickness | µm |
| Sample Forms | Liquids (gasoline, diesel, naphtha, jet fuel, crude oil, residuum, aqueous samples), Solids (catalysts, polypropylene), Powders |
| Compliance Standards | ASTM D7039, ASTM D5059, SH/T 0842, SH/T 0977, SH/T 0993 |
| Automation | Integrated 12-position autosampler |
| Optical System | Multi-crystal automatic switching optics with monochromatic excitation |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Supermini200 |
| Instrument Type | Benchtop WDXRF Spectrometer |
| Excitation Source | Pd-anode X-ray tube (50 kV / 4 mA, 200 W) |
| Analyzed Elements | Total S, Total Cl, Total Si, Total Pb |
| Detection Limits | S: 0.15 ppm, Cl: 0.1 ppm, Si: 0.5 ppm, Pb: 0.2 ppm |
| Quantification Range | 0–99.99% |
| Optical Configuration | Single-wavelength excitation with automated multi-crystal changer (RX4, RX9, and others) |
| Sample Handling | 12-position automatic sample changer |
| Compliance Standards | GB/T 111140 (S), SH/T 6083 (Cl & Si), ASTM D5059 (Pb) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Elemental Range | Na (11) to U (92) |
| Detector | Flow Proportional Counter (F-PC) and Scintillation Counter |
| Sample Handling | 12-position Automatic Sampler |
| Operating Atmosphere | Air, He, or Vacuum |
| Dimensions | 580(W) × 670(H) × 680(D) mm |
| Power Supply | 200–240 V, 10 A |
| Grounding Resistance | <30 Ω |
| Ambient Temperature | 10–40 °C |
| Relative Humidity | <80% RH |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Benchtop |
| X-ray Tube Power | 200 W |
| Target Material | Pd |
| Detector Types | Flow-proportional Counter (F-PC) and Scintillation Counter (SC) |
| Analytical Elements | Na (11) to U (92) |
| Configuration | Multi-channel WDXRF |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | TG-DTA |
| Temperature Range | RT–1100°C (standard), RT–1500°C (high-temp) |
| Max Heating Rate | 100°C/min |
| Atmosphere Options | Air, inert gas, flowing gas, vacuum |
| Max Sample Mass | 1 g |
| TG Range | ±0.1–±250 mg |
| TG Sensitivity | 0.1 µg |
| DTA Range | ±1.5–±1000 µV |
| Sample Crucible | φ2 mm × 2.5 mm height |
| Sample Holder Configuration | Horizontal dual-beam differential triple-coil balance (Rigaku patented) |
| Cooling | Forced rapid cooling (1500°C → 50°C in ≤20 min) |
| Optional Accessories | ASC-24 Auto Sampler, IR Heating Furnace, TG-DTA/GC-MS coupling interface |
| Software | Multi-station control (up to 8 units), SIA/DRC/CRC dynamic thermal analysis modes, ECO power-saving mode (30% reduction), real-time instrument status display, automated calibration & diagnostics, dual-data backup, FDA 21 CFR Part 11–compliant audit trail (optional), network-enabled firmware updates |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | TMA8310 |
| Sample Capacity | Ø9 mm × 20 mm (max) |
| Heating Rate | Up to 100 °C/min |
| Cooling Rate | From 1000 °C to 50 °C in ≤15 min |
| Temperature Control | Pre-compensated PID with hold-mode overshoot correction |
| Compliance | Designed for GLP/GMP environments |
| Software | Multi-station control (up to 8 units per PC) |
| Safety | Integrated furnace safety alarm, emergency stop, ergonomic sample handling fixture |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | Ultima IV Series |
| Instrument Type | Powder X-ray Diffractometer |
| X-ray Generator Power | 3 kW |
| Goniometer | Horizontal Type |
| Minimum Angular Step | 0.0001° |
| Optical System | CBO Cross-Beam Optics (Patented) |
| Detector | D/teX-Ultra High-Speed Energy-Dispersive Detector |
| Optional Modules | In-Plane Geometry Unit, Small-Angle X-ray Scattering (SAXS) Module, Thin-Film Analysis Module, Micro-Beam Mapping Unit, XRD-DSC Simultaneous Measurement System |
| Software Suite | PDXL (with Rietveld), NANO-Solver, GXRR, and XRD Analysis Package |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | WDA-3650 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Detector Configuration | High-sensitivity AD-Boron channel for boron analysis |
| Instrument Architecture | Hybrid scanning + fixed-channel (multi-channel) WD-XRF |
| Sample Compatibility | Up to 200 mm wafers and magnetic/optical disks |
| Automation | Fully automated daily calibration (AutoCal), C-to-C robotic handler compatible (optional), SECS/GEM interface support |
| Vacuum & Thermal Stability | Integrated vacuum stabilization and active cooling systems |
| Footprint | 1.12 m (W) × 1.45 m (H) × 0.89 m (D) |
| Mass | 600 kg |
| Power Supply | 3-phase 200 VAC 50/60 Hz, 30 A or single-phase 220–230 VAC 50/60 Hz, 40 A |
| Regulatory Compliance | Designed for GLP/GMP environments |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | XGT-5700 |
| Price Range | USD 42,000–70,000 (FOB) |
| Instrument Type | Scanning Micro-XRF |
| Analytical Element Range | Na (Z=11) to U (Z=92) |
| Primary Beam Diameter Options | 3 mm (standard), 100 µm, 10 µm |
| Primary Beam Filtration | Auto-switching for 3 mm beam (4 filters) |
| Secondary Beam Filtration | Motorized ON/OFF filter for enhanced sensitivity in regulated heavy metal analysis (e.g., Pb, Cd, Hg, Cr, Br) |
| Detector | Liquid-nitrogen-cooled, high-purity Si(Li) detector (3 L Dewar capacity) |
| Maximum Sample Dimensions | 350 × 400 × 40 mm |
| Stage Scan Range | Standard 100 × 100 mm |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Detector | PILATUS200K Hybrid Pixel Array Detector |
| Detector Pixel Size | 172 µm |
| Dynamic Range | 1 × 10⁶ photons/pixel |
| Operating Temperature | Ambient (No Cryogenic Cooling Required) |
| X-ray Source Options | MicroMax003 (Cu or Mo), DualSource (Cu + Mo), MicroMax007HF, MicroMax007HF-DW, MultiMax9 |
| Goniometer Types | Partial χ, Fixed χ, Three-Axis AFC-Kappa, Four-Axis Kappa |
| Optional Accessories | Low-Temperature Device (e.g., Oxford Cryostream) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLAB Synergy |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Floor-Standing |
| Power Stability | < 0.0001 (unitless, indicating angular reproducibility or beam stability per manufacturer specification) |
| Detector | HyPix-6000HE Photon-Counting Pixel Array Detector |
| Detector Active Area | 77.5 mm × 80.0 mm |
| Pixel Size | 100 µm × 100 µm |
| Cooling Method | Air-Cooled |
| Dynamic Range | Up to 31-bit equivalent |
| Readout Mode | Shutterless, 0-ms dead time |
| Goniometer | AFC-Kappa Four-Axis |
| X-ray Source Options | Microfocus Sealed-Tube (Cu/Mo), MM007HF Rotating Anode, FR-X High-Brilliance Rotating Anode |
| Anode Materials | Cu, Mo, or Dual Cu/Mo |
| Cryogenic Capability | Integrated Low-Temperature System (e.g., Oxford Instruments Cryostream-compatible) |
| Software Suite | CrysAlisPro (data collection & processing), AutoChem (automated structure solution and refinement) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | XtaLABmini |
| Instrument Type | Single-Crystal X-ray Diffractometer |
| Configuration | Benchtop |
| X-ray Source | Mo Kα, 600 W high-frequency generator |
| Goniometer Axes | χ fixed at 54°, Φ rotation: −360° to +360° about sample center axis, ω range: 2θ ± 90° (−60° to +120°), 2θ fixed at 30° |
| Sample Viewing | 70× CCD microscope with 50 mm camera-to-sample distance |
| Detector | CCD, active area Φ75 mm, pixel sizes 73.2 µm / 146.4 µm, resolution modes 1024 × 1024 / 512 × 512, readout times 2.24 s / 0.56 s, dark current 0.1 e⁻/pixel/s |
| Optional | Cryogenic sample stage (e.g., Oxford Instruments Cryostream-compatible) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus 400 |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Maximum Sample Diameter | 400 mm |
| Maximum Sample Thickness | 50 mm |
| Maximum Sample Mass | 30 kg |
| Measurement Spot Size | 0.5–30 mm (5-step motorized selection) |
| Compliance | SEMI, CE |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus II |
| Excitation Source | End-window Rh-target X-ray tube (3 kW or 4 kW) |
| High-voltage Generator | High-frequency inverter type |
| Max. Output | 60 kV / 150 mA (4 kW) |
| Stability | ±0.005% (against ±10% AC line fluctuation) |
| Cooling | Integrated water-cooling system |
| Sample Changer Capacity | Up to 48 positions |
| Sample Dimensions | Ø51 mm × 40 mm (H) |
| Analyzed Area | Up to Ø35 mm |
| Sample Rotation | 30 rpm |
| Primary Beam Filters | Al, Ti, Cu, Zr (4-position auto-switch) |
| Collimators | 6 automatic apertures (Ø35, 30, 20, 10, 1, 0.5 mm) |
| Divergence Slits | 3 types (standard, high-resolution, ultra-light-element option) |
| Receiving Slits | SC and F-PC compatible |
| Goniometer | Independent θ–2θ drive |
| Angular Range | SC: 5°–118°, F-PC: 13°–148° |
| Max. Scan Speed | 1400°/min (2θ) |
| Continuous Scan Rate | 0.1–240°/min |
| Crystal Changer | 10-position auto-exchange |
| Standard Crystals | LiF(200), Ge, PET, RX25 |
| Optional Crystals | LiF(220), RX4, RX9, RX35–RX80, RX61F, TAP |
| Vacuum System | Dual-chamber rapid evacuation (dual-pump configuration) |
| Detectors | SC scintillation counter (1000 kcps linearity) for heavy elements |
| Pulse Height Analyzer (PHA) | Auto-adjustment (PAS, Rigaku patent) |
| F-PC Anode Wire Cleaning | Automatic thermal cleaning (ACC, Rigaku patent) |
| Optional Accessories | He purge module (with baffle), temperature-controlled sample stage (36.5 °C), CCD-based micro-imaging (100 µm resolution, 0.5 mm micro-area analysis & mapping), r-θ sample stage (Rigaku patent) |
| Software | NEW SQX (qualitative ID, background subtraction, smoothing, peak deconvolution, calibration curve method per JIS, matrix correction, standardless quantification, EZ-scan templates, auto-aperture selection, precision testing, email reporting, multi-standard management) |
| Compliance | Designed for GLP/GMP environments |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus III+ |
| Configuration | Benchtop/Floor-standing |
| Application Type | General-purpose |
| Element Range | Na (11) to U (92) |
| Detection Limit | Sub-ppm to % level (matrix-dependent) |
| Energy Resolution | ≤145 eV at Mn Kα |
| Repeatability | RSD < 0.5% for major elements (≥1 wt%), < 2% for trace elements (≤100 ppm) |
| Vacuum Mode | Dual-rate programmable vacuum pump control (fast/slow evacuation & venting) |
| Sample Handling | Motorized XYZ stage with ±1 µm positioning accuracy |
| Optical System | Collimated polycapillary optics with automatic height compensation |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ZSX Primus IIInext |
| Instrument Type | Floor-standing |
| Instrument Kind | Scanning-type |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Configuration | Benchtop or Floor-Standing |
| Element Range | Na (11) to U (92) |
| Simultaneous Channels | Standard 16, Upgradable to 30 or 40 |
| X-ray Tube | 3 kW (Optional 4 kW), 60 kV / 80 mA |
| Stability | ±0.005% against ±10% mains voltage fluctuation |
| Sample Changer | Standard 8-position, Optional 20/50/100-position (4 s load time) |
| Vacuum System | Dual-speed pumping with Automatic Pressure Control (APC) |
| Detector | Flow-proportional counters + Scintillation counter |
| Background Correction | Patented Fixed-Channel Background Subtraction |
| Software | Multi-tasking, multi-window, fully localized Chinese interface with FP (Fundamental Parameters) quantification engine |
| Compliance | Designed for ISO 8597, ASTM E1361, and JIS Z 3212 |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported Instrument |
| Model | ZSX Primus IV |
| Price Range | USD 210,000 – 280,000 (FOB Yokohama) |
| Instrument Type | Scanning WDXRF |
| X-ray Tube Power | 4 kW |
| Elemental Coverage | Beryllium (Be, Z=4) to Curium (Cm, Z=96) |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IV |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be to U |
| Scan Speed | 2400°/min |
| Detector Linear Range | SC 1800 kcps, FPC 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus IVi |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be (4) to U (92) |
| Scan Speed | 2400°/min |
| Detector Linear Count Rate | SC: 1800 kcps |
| FPC | 3000 kcps |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Brand | Rigaku |
|---|---|
| Origin | Japan |
| Model | ZSX Primus |
| Instrument Type | Floor-standing |
| X-ray Tube Power | 4 kW |
| Elemental Range | Be–U |
| Scan Speed | 2400°/min |
| Beryllium Window Thickness | 30 µm |
| Goniometer Angular Reproducibility | ±0.0001° |
| Origin | Japan |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VM-82 |
| Pricing | Available Upon Request |
| Origin | USA |
|---|---|
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | RM.YOUNG 81000RE |
| Pricing | Available Upon Request |
