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| Brand | X-Rite |
|---|---|
| Origin | USA |
| Model | ERX56 |
| Measurement Geometry | ±15°, ±45°, ±60° (bidirectional reflectance) |
| Spectral Range | 330–730 nm |
| Spectral Interval | 1 nm |
| Measurement Repeatability (White Tile) | ΔL*, Δa*, Δb* < 0.03 |
| Working Distance | 10 mm |
| Measurement Method | Flash-based pulsed xenon illumination |
| Calibration Frequency | External calibration recommended every 28 days |
| Optical Architecture | True dual-beam with auto-wavelength validation |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | TeleFlash 445 |
| Pricing | Available Upon Request |
| Short-Term Repeatability (White) | < 0.03 ΔE(CMC) |
| Geometry | 45°/0° |
| Measurement Method | Flash Spectrophotometry |
| Working Distance | 55 mm |
| Spectral Range | 400–700 nm |
| Spectral Interval | 20 nm |
| Measurement Area | 30 mm Ø |
| Thermal Compensation | Ambient-Temperature Referenced Data Recalculation for Hot Substrates |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ERX130 |
| Pricing | Upon Request |
| Short-Term Repeatability (White Tile) | ΔL*, Δa*, Δb* < 0.03 |
| Illumination Geometry | 45°/0° (Coaxial Illumination) |
| Measurement Time | Flash-based |
| Working Distance | 300 mm |
| Spectral Range | 330–730 nm |
| Spectral Interval | 1 nm |
| Measurement Spot Size | 90 mm |
| Calibration Interval | External calibration recommended every 4 weeks |
| Optical Design | True Dual-Beam Architecture |
| Wavelength Calibration | Automatic onboard reference |
| Brand | Systech Illinois |
|---|---|
| Origin | United Kingdom |
| Model | 8102 |
| Measurement Principle | Coulometric Sensor (Electrochemical Oxygen Detection) |
| Standards Compliance | ASTM D3985, ASTM F1307, ASTM F1927, DIN 53380-3, ISO 15105-2, JIS K 7126 |
| OTR Range | 0.05–432,000 cc/(m²·day) |
| Resolution | 0.01 cc/(m²·day) |
| Repeatability | ±0.015 cc/(m²·day) or ±1% |
| Test Chamber Temperature Range | 10–40 °C (±0.1 °C) |
| Film RH Control | 0–100% RH (dry to saturated via humidified sponge) |
| Package RH Control | Ambient or chamber-controlled |
| Sensor Technology | Long-life e-Metric® coulometric cell |
| Anti-Surge™ Protection | Yes |
| Gas Requirement | Ambient air only (no N₂/H₂ mix required) |
| Brand | Systech Illinois |
|---|---|
| Origin | United Kingdom |
| Model | 8700 |
| Measurement Range (Pack) | 0.00004–2000 cm³/pack/day |
| Measurement Range (Film) | 0.04–100,000 cm³/m²/day |
| Test Temperature | Ambient (with optional temperature-controlled chamber) |
| Relative Humidity Control | Dry to 100% RH (saturated) |
| Calibration Standards | NIST-traceable reference films and certified gases |
| Dimensions | 760 × 590 × 350 mm |
| Weight | 65 kg |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Model | ERX145 |
| Geometry | 45°a:0° |
| Spectral Range | 330–730 nm |
| UV Capability | Integrated annular UV ring |
| Wavelength Accuracy | < 0.1 nm (absolute, auto-calibrated) |
| Measurement Time | 20 ms |
| Aperture Size | 30 mm |
| Working Distance | 65 mm (±10 mm tolerance for dE* < 0.2) |
| Measurement Interval | 3 s |
| CIELAB Repeatability | dL*, da*, db* ≤ 0.03 (SD on white tile) |
| Inter-instrument Agreement | dL*, da*, db* ≤ 0.1 (BCRA Series II, avg. dE* < 0.3) |
| Dimensions (EPX) | 282 × 298 × 269 mm³ |
| Weight (EPX) | 13.5 kg |
| IP Rating (EPX) | IP53 |
| Dimensions (Measurement Head) | ~265 × 265 × 155 mm |
| Weight (Measurement Head) | 2.3 kg |
| IP Rating (Measurement Head) | IP65 |
| Dimensions (ECX Controller) | ~265 × 265 × 135 mm |
| Weight (ECX) | 2.4 kg |
| IP Rating (ECX) | IP65 |
| Communication | CAN bus (500 m max), USB (1.5–3 m) |
| Power | EPX: 115/230 V AC, ±15%/+25%, 45–440 Hz, ≤50 VA (typ. 25 VA) |
| ECX | ≤100 VA (typ. 10 VA) |
| Calibration | PTB-certified white standard (Germany) |
| Operating Ambient Temperature | Up to 50 °C |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | CarFlash |
| Pricing | Upon Request |
| Short-Term Repeatability | ΔE < 0.1 (White) |
| Measurement Geometry | 15°/25°/45°/75° |
| Measurement Time | 3 s (including robotic positioning) |
| Working Distance | 35 mm |
| Spectral Range | 400–700 nm |
| Spectral Interval | 10 nm |
| Brand | Systech Illinois |
|---|---|
| Origin | United Kingdom |
| Model | 8107 |
| Measurement Principle | Coulometric Sensor (ASTM F1307) |
| Test Range | 0.00025–2000 cm³/(pkg·day) |
| Resolution | 0.00001 cm³/(pkg·day) |
| Repeatability | ±0.00001 cm³/(pkg·day) or ±2% |
| Sensor Technology | Long-life E-metric Coulometric Cell |
| Protection | Anti-Surge™ Over-O₂ Compensation |
| Gas Requirement | Ambient air only (no N₂/H₂ mix required) |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | VeriColor Spectro |
| Pricing | Available Upon Request |
| Short-Term Repeatability (White) | ≤0.05 ΔEab |
| Geometry | 30°/0° |
| Measurement Time | 1 s |
| Working Distance | 4 in (102 mm) |
| Spectral Range | 400–700 nm |
| Spectral Interval | 10 nm |
| Number of Channels | 31 |
| IP Rating | IP67 |
| NEMA Enclosure Rating | NEMA-4 |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Manufacturer Type | Authorized Distributor |
| Origin Category | Imported |
| Model | ERX3 |
| Pricing | Upon Request |
| Brand | X-Rite |
|---|---|
| Origin | USA |
| Model | ERX50 |
| Measurement Geometry | 45°/0° |
| Short-Term Repeatability (White Tile) | ΔL*, Δa*, Δb* < 0.03 |
| Measurement Time | 20 ms |
| Working Distance | 10 mm |
| Spectral Range | 330–730 nm |
| Spectral Interval | 1 nm |
| Calibration Interval | External calibration recommended every 4 weeks |
| Optical Design | True Dual-Beam with Automatic Wavelength Calibration |
| Compliance | ISO 9001 traceable documentation, aligned with ASTM E308 and CIE 15:2018 |
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